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小敏给大家介绍一下(slow)QTestStationSeries太阳能电池光谱响应/量子效率(QE/IPCE)测试系统,以下(slow)QTestStationSeries太阳能电池光谱响应/量子效率(QE/IPCE)测试系统的内容是小敏网上整理,希望对您有用。
QTest Station 1000 / 2000 Solar Cell Quantum Efficiency or IPCE Measurement System |
Features: | Applicable Photovoltaic Devices: |
◆ A turn key, fully automatic QE / IPCEmeasurement | Silicon |
station in compliance with all major international | Si (crystalline) |
standards for PV testing,such as ASTM and IEC | Si (multicrystalline) |
etc. | Si (thin-film transfer) |
◆State of the art system suited for all categories of | Amorphous/nanocrystalline Si |
PV devices | Si (amorphous) |
◆Multi-junction solar cell measurement | Si (nanocrystalline) |
◆Extremely stable light source and high signalto | III–V cells |
noise ratio | GaAs (crystalline) |
◆Wide spectral range from deep UV to MID-IR, | GaAs (thin film) |
extendable to other range | GaAs (multicrystalline) |
◆Integrating sphere module for both External QE | InP (crystalline) |
and Internal QE testing | Thin-film chalcogenide |
◆Measurement of PV devices with slow time | CIGS (cell) |
response, such as dye sensitised | CdTe (cell) |
◆Calculation of Isc under AM0, AM1.5D and AM1.5G | Photochemical |
◆System expandable to PL measurement with | Dye sensitised |
optional modules for customers with limited budget | Organic |
◆Advanced modular design with a great variety of | Organic polymer |
options to best fit the need of inpiduallaboratory | Multijunction devices |
◆ Intuitive Interface for operations | GaInP/GaAs/Ge |
◆Appropriate for use in either research and | GaInP/GaAs |
development applications or in product quality | GaAs/CIS (thin film) |
control by manufacturers | a-Si/mc-S |
The spectral responsivity of a photovoltaic device is useful for understanding device performance andmateria |
characteristics. The quantum efficiency (QE) or IPCE is a quantity defined as the percentage of photons |
hitting the photoreactive surface that will produce the current obtained outside the device,and normally reported |
over the wavelength range λ.(unit: nm) to which the device responds: |
QE(λ) = 1240 R(λ)/λ |
In which, R(λ) (unit: A/W) is defined as the output current (short circuit current) per input irradiance |
or radiant power at a given wavelength. |
QE or IPCE is an accurate measurement of the device"s electrical sensitivity to light. The Quantum Efficiency |
of a solar cell is a very important measure for solar cells as it gives information on the current that a given cell |
will produce when illuminated by a particular wavelength. If the quantum efficiency is integrated (summed) over |
the whole solar electromagnetic spectrum, one can evaluate the current that a cell will produce |
when exposed to the solar spectrum. The ratio between this current and the highest possible |
current(if the QE was * over the whole spectrum) gives the electrical efficiency of the solar cell. System Specifications: |
Wavelength Range | Light Source | 250nm – 2500nm, Other Wavelength Optional |
Monochromator | 185nm – 3600nm, Others Wavelength Optional |
Calibration Detector | Si: 200 nm – 1100nm |
InGaAs and Others Optional |
Wavelength Resolution | 0.1nm – 20nm |
Stray Light | Single Monochromator, Better Than 10-4at 220nm (Nal) For QTest 1000 |
Double Monochromator, Better Than 10-9 at 220nm (Nal) For QTest 2000 |
Sample Illuminating Area | From Sub-millimeter to 156x156mm or larger, User Changeable |
Sample Chamber | D500 x W400 x H250mm, Other Size Optional |
Data Acquisition Module | AC Measurement: Lock-in AmplifierSensitivity: 2 nV to 1 VCurrent input: 106 or 108 V/A |
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DC Measurement: Multimeter / Source Meter and Pre-amplifier |
Computer Interface | RS232 Standard, USB and IEEE-488 optional |
Software | Hardware Setup and Control:Wavelength ScanningInput / Output Slits AdjustmentGratings changingFilter Wheel ControlSetup and Data Collection of Lock-in Amplifier or Multimeter / Source Meter | Data Acquisition:Real Time DisplaySystem CalibrationData AnalyzingData StorageReport printingReflectivity and Transmittance for EQE and IQE |
Other options | Temperature ControlMultijunction Cell Measurements |